| Contact |
Prof. Colin Humphreys |
| Group |
Department of Materials Science and Metallurgy |
| Organisation |
University of Cambridge |
| Address |
Pembroke Street
Cambridge
CB2 3QZ
UK |
| Phone |
01223-334457/334458 |
| Fax |
01223-334437 |
| Email |
colin.humphreys@msm.cam.ac.uk |
| Website |
|
| Competences |
Routine analysis of GaN growth via RHEED and TEM High resolution structural
analysis of growth defects Chemical analysis via X-ray and energy loss
spectroscopy Retrieval of local electronic structure via high spatial
resolution electron energy loss spectroscopy Composition sensitive imaging via
energy filtering Site specific TEM using FIB Doping contrast in FEGSEM |
| Equipment |
For conventional and analytical microscopy: Philips CM30, JEOL 2000FX For
energy filtered imaging: JEOL 4000FX, Philips CM300FEG For high resolution
imaging: JEOL 4000EX For high spatial resolution chemical and electronic
structure analysis: VG HB501 STEM For preparation of site specfic TEM
specimens: FEI FIB workstation For doping contrast: JEOL FEGSEM |
